Nguyên lý kiểm tra bằng tia X công nghiệp
X-ray flaw detection is a nondestructive testing method to find defects by using X-ray's ability to penetrate material and have attenuation in material. X-ray wavelengths are very short, typically 0.001 to 0.1nm. X-rays travel in straight lines at the speed of light and are impervious to electric and magnetic fields. They penetrate matter and attenuate as they pass through, making the film sensitive.
When X-ray penetrates matter, a series of extremely complex physical processes will be produced due to the interaction between X-ray and matter. As a result, the radiation will be absorbed and scattered, and part of its energy will be lost, and its intensity will be reduced correspondingly. This phenomenon is called the attenuation of ray. X-ray flaw detection is the essence of defect according to the inspection and its internal work piece medium at different levels of gamma ray energy attenuation, caused by the radiation intensity difference after through the workpiece, the photosensitive material defect (film) on the projection of latent image, after dealing with the darkroom for defect image, and internal control standards to assess workpiece defect and the properties of the film.